1. Understanding and Improving Defects in Silicon Carbide Semiconductor Devices Open Access Author: Storey, Matthew Joseph Title: Understanding and Improving Defects in Silicon Carbide Semiconductor Devices Area of Honors: Engineering Science Keywords: SiCdefect densitysemiconductorsilicon carbideelectrical measurement File: Download Storey_Matthew_SiC_Thesis.pdf Thesis Supervisors: Dr. Patrick M Lenahan, Thesis SupervisorDr. Patrick M Lenahan, Thesis SupervisorBernhard R Tittmann, Thesis Honors AdvisorJudith A Todd Copley, Faculty Reader
2. Investigation of Metal Contacts to Group III-nitride Semiconductors Open Access Author: Glickstein, James Jay Title: Investigation of Metal Contacts to Group III-nitride Semiconductors Area of Honors: Materials Science and Engineering Keywords: semiconductorIII-VIII-NitrideGaNInNwurtzitecrystal polaritymetal contact File: Download thesis_final.pdf Thesis Supervisors: Suzanne E Mohney, Thesis SupervisorIvica Smid, Faculty ReaderJudith A Todd Copley, Faculty ReaderSuzanne E Mohney, Thesis Honors Advisor
