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Author:: Carrier, Robert Scott
Title:: INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE
Area of Honors:: Engineering Science
Keywords:: bipolar junction transistor
EDMR
pn junctions
magnetometer
silicon carbide
spin dependent recombination
semiconductor spectroscopy
File:: Download Robert_Carrier_Thesis_Final.pdf
Thesis Supervisors:: Dr. Patrick M Lenahan, Thesis Supervisor
Dr. Patrick M Lenahan, Thesis Honors Advisor
Saptarshi Das, Faculty Reader

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