1. Understanding and Improving Defects in Silicon Carbide Semiconductor Devices Open Access Author: Storey, Matthew Joseph Title: Understanding and Improving Defects in Silicon Carbide Semiconductor Devices Area of Honors: Engineering Science Keywords: SiCdefect densitysemiconductorsilicon carbideelectrical measurement File: Download Storey_Matthew_SiC_Thesis.pdf Thesis Supervisors: Dr. Patrick M Lenahan, Thesis SupervisorDr. Patrick M Lenahan, Thesis SupervisorBernhard R Tittmann, Thesis Honors AdvisorJudith A Todd Copley, Faculty Reader
