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Author:

Carrier, Robert Scott

Title:

INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE

Area of Honors:

Engineering Science

Keywords:

bipolar junction transistor
EDMR
pn junctions
magnetometer
silicon carbide
spin dependent recombination
semiconductor spectroscopy

File:

Download Robert_Carrier_Thesis_Final.pdf

Thesis Supervisors:

Dr. Patrick M Lenahan, Thesis Supervisor
Dr. Patrick M Lenahan, Thesis Honors Advisor
Saptarshi Das, Faculty Reader