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1. INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE

Open Access
Author:
Carrier, Robert Scott
Title:
INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE
Area of Honors:
Engineering Science
Keywords:
File:
Thesis Supervisors:
  • Patrick M Lenahan, Thesis Supervisor
  • Patrick M Lenahan, Honors Advisor
  • Saptarshi Das, Faculty Reader