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Author:

McCormick, Brian T

Title:

Long Term Electrical Stability Testing of Zinc Oxide Thin Film Transistors

Area of Honors:

Electrical Engineering

Keywords:

Zinc-Oxide
Thin Film Transistor
ZnO
TFT
Testing
Measurement

File:

Download BrianMcCormick_ZincOxideStabilityThesis.pdf

Thesis Supervisors:

Thomas Nelson Jackson, Thesis Supervisor
Thomas Nelson Jackson, Thesis Supervisor
John Douglas Mitchell, Thesis Honors Advisor