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Author:

Storey, Matthew Joseph

Title:

Understanding and Improving Defects in Silicon Carbide Semiconductor Devices

Area of Honors:

Engineering Science

Keywords:

SiC
defect density
semiconductor
silicon carbide
electrical measurement

File:

Download Storey_Matthew_SiC_Thesis.pdf

Thesis Supervisors:

Dr. Patrick M Lenahan, Thesis Supervisor
Dr. Patrick M Lenahan, Thesis Supervisor
Bernhard R Tittmann, Thesis Honors Advisor
Judith A Todd Copley, Faculty Reader