1. INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE Open Access Author: Carrier, Robert Scott Title: INVESTIGATING PERFORMANCE LIMITING DEFECTS IN SILICON CARBIDE BIPOLAR JUNCTION TRANSISTORS USING ELECTRICALLY DETECTED MAGNETIC RESONANCE Area of Honors: Engineering Science Keywords: bipolar junction transistorEDMRpn junctionsmagnetometersilicon carbidespin dependent recombinationsemiconductor spectroscopy File: Download Robert_Carrier_Thesis_Final.pdf Thesis Supervisors: Dr. Patrick M Lenahan, Thesis SupervisorDr. Patrick M Lenahan, Thesis Honors AdvisorSaptarshi Das, Faculty Reader
