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1. Long Term Electrical Stability Testing of Zinc Oxide Thin Film Transistors

open_access

Open Access

Author:: McCormick, Brian T
Title:: Long Term Electrical Stability Testing of Zinc Oxide Thin Film Transistors
Area of Honors:: Electrical Engineering
Keywords:: Zinc-Oxide
Thin Film Transistor
ZnO
TFT
Testing
Measurement
File:: Download BrianMcCormick_ZincOxideStabilityThesis.pdf
Thesis Supervisors:: Thomas Nelson Jackson, Thesis Supervisor
Thomas Nelson Jackson, Thesis Supervisor
John Douglas Mitchell, Thesis Honors Advisor