1. Long Term Electrical Stability Testing of Zinc Oxide Thin Film Transistors Open Access Author: McCormick, Brian T Title: Long Term Electrical Stability Testing of Zinc Oxide Thin Film Transistors Area of Honors: Electrical Engineering Keywords: Zinc-OxideThin Film TransistorZnOTFTTestingMeasurement File: Download BrianMcCormick_ZincOxideStabilityThesis.pdf Thesis Supervisors: Thomas Nelson Jackson, Thesis SupervisorThomas Nelson Jackson, Thesis SupervisorJohn Douglas Mitchell, Thesis Honors Advisor
