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3. Understanding and Improving Defects in Silicon Carbide Semiconductor Devices

open_access
Open Access
Author:
Storey, Matthew Joseph
Title:
Understanding and Improving Defects in Silicon Carbide Semiconductor Devices
Area of Honors:
Engineering Science
Keywords:
SiC
defect density
semiconductor
silicon carbide
electrical measurement
File:
Download Storey_Matthew_SiC_Thesis.pdf
Thesis Supervisors:
Dr. Patrick M Lenahan, Thesis Supervisor
Dr. Patrick M Lenahan, Thesis Supervisor
Bernhard R Tittmann, Thesis Honors Advisor
Judith A Todd Copley, Faculty Reader

4. An Investigation of the Electron Transport Mechanisms in Silicon Carbide for use as a Low-k Dielectric

open_access
Open Access
Author:
Ebersole, Chad Martin
Title:
An Investigation of the Electron Transport Mechanisms in Silicon Carbide for use as a Low-k Dielectric
Area of Honors:
Engineering Science
Keywords:
low-k
dielectric
semiconductor
electron transport
SiC
silicon carbide
File:
Download Chad_Ebersole_-_Thesis.pdf
Thesis Supervisors:
Dr. Patrick M Lenahan, Thesis Supervisor
Dr. Patrick M Lenahan, Thesis Honors Advisor
Christine Masters, Faculty Reader